Visningssätt för begreppens/termernas förhållanden:
Det sätt begreppsrelationer visas:
Det sätt begreppsrelationer visas:
Koetinpyyhkäisymikroskopia
Hierarki: | ∟ ∟ ∟ ∟ ∟ Koetinpyyhkäisymikroskopia 10 sidobegrepp2 underordnad begrepp∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Koetinpyyhkäisymikroskopia 10 sidobegrepp2 underordnad begrepp∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Koetinpyyhkäisymikroskopia 10 sidobegrepp2 underordnad begrepp∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ |
Bredare villkor: | |
Snävare villkor: | |
Anmärkning: | Microscopy, Atomic Force (1999)X |
Anmärkning: | Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
X |
historyNote*: | 2000; use MICROSCOPY, ATOMIC FORCE 1999
X |
publicMeSHNote*: | 2000; see MICROSCOPY, ATOMIC FORCE 1999
X |
activeMeSHYear*: | |
dateCreated*: | 1999-11-03X |
dateEstablished*: | 2000-01-01X |
dateRevised*: | 2004-07-07X |
recordAuthorizer*: | sjnX |
recordMaintainer*: | nnsX |
recordOriginator*: | agsX |
Typ: | |
Samordna villkor: | |
URI: | |
Termer och motsvarande begrepp: | Microscopy, Scanning Probe (en) XScanning Probe Microscopy (en, ersatt) |
Dela: |
Laddar resultat...