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Det sätt begreppsrelationer visas:
Det sätt begreppsrelationer visas:
Elektronmikroskopi
Hierarki: | ∟ ∟ ∟ ∟ ∟ Elektronmikroskopi 10 sidobegrepp5 underordnad begrepp∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Elektronmikroskopi 10 sidobegrepp5 underordnad begrepp∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Elektronmikroskopi 10 sidobegrepp5 underordnad begrepp∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ |
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Anmärkning: | Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
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Annotation: | GEN: prefer specifics; relation to /ultrastruct: Manual 26.12.1
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activeMeSHYear*: | |
dateCreated*: | 1999-01-01X |
dateRevised*: | 2004-07-28X |
recordAuthorizer*: | jlsX |
recordMaintainer*: | jlsX |
recordOriginator*: | NLMX |
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Termer och motsvarande begrepp: | Elektronimikroskopia (fi) XEM (fi, ersatt) Mikroskopi, elektron (sv, ersatt) Microscopy, Electron (en) Electron Microscopy (en, ersatt) Electronmicroscopia (la-FI, ersatt) |
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