The way property values are displayed:
The way concept relations are shown:
The way concept relations are shown:
Microscopy, Scanning Probe
Hierarchy: | ∟ ∟ ∟ ∟ ∟ Microscopy, Scanning Probe 10 coordinate concepts2 subordinate concepts∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Microscopy, Scanning Probe 10 coordinate concepts2 subordinate concepts∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Microscopy, Scanning Probe 10 coordinate concepts2 subordinate concepts∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ |
Broader terms: | |
Narrower terms: | |
History note: | Microscopy, Atomic Force (1999)X |
historyNote*: | 2000; use MICROSCOPY, ATOMIC FORCE 1999
X |
publicMeSHNote*: | 2000; see MICROSCOPY, ATOMIC FORCE 1999
X |
Scope note: | Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
X |
activeMeSHYear*: | |
dateCreated*: | 1999-11-03X |
dateEstablished*: | 2000-01-01X |
dateRevised*: | 2004-07-07X |
recordAuthorizer*: | sjnX |
recordMaintainer*: | nnsX |
recordOriginator*: | agsX |
Type: | |
Coordinate terms: | |
URI: | |
Labels and equivalent concepts: | Koetinpyyhkäisymikroskopia (fi) XScanning Probe Microscopy (en, replaced) |
Share: |
Loading results...