ONKI3 | Medical Subject Headings

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The way property values are displayed: value/row values side by side

The way concept relations are shown: separately in hierarchy

Spectrometry, Mass, Secondary Ion

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Hierarchy:	Medical Subject Headings (MeSH) ∟ Investigative Techniques ∟ Chemistry, Analytical ∟ Mass Spectrometry ∟ Spectrometry, Mass, Secondary Ion 5 coordinate concepts ∟ Gas Chromatography-Mass Spectrometry \| ∟ Spectrometry, Mass, Electrospray Ionization \| ∟ Spectrometry, Mass, Fast Atom Bombardment \| ∟ Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization \| ∟ Tandem Mass Spectrometry Medical Subject Headings (MeSH) ∟ Natural Sciences ∟ Chemistry ∟ Chemistry, Analytical ∟ Mass Spectrometry ∟ Spectrometry, Mass, Secondary Ion 5 coordinate concepts ∟ Gas Chromatography-Mass Spectrometry \| ∟ Spectrometry, Mass, Electrospray Ionization \| ∟ Spectrometry, Mass, Fast Atom Bombardment \| ∟ Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization \| ∟ Tandem Mass Spectrometry X
Broader terms:	Medical Subject Headings (MeSH) ∟ Investigative Techniques ∟ Chemistry, Analytical ∟ Mass Spectrometry ∟ Spectrometry, Mass, Secondary Ion Medical Subject Headings (MeSH) ∟ Natural Sciences ∟ Chemistry ∟ Chemistry, Analytical ∟ Mass Spectrometry ∟ Spectrometry, Mass, Secondary Ion Mass Spectrometry > Chemistry, Analytical > Investigative Techniques > Medical Subject Headings (MeSH) Mass Spectrometry > Chemistry, Analytical > Chemistry > Natural Sciences > Medical Subject Headings (MeSH) X
Annotation:	for SIMS microscopy, coordinate with type of microscopy X
History note:	Spectrum Analysis, Mass (1976-1994)X
historyNote*:	95 X
publicMeSHNote*:	95 X
Scope note:	A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions. X
activeMeSHYear*:	2007X
dateCreated*:	1994-05-12X
dateEstablished*:	1995-01-01X
dateRevised*:	2006-07-05X
recordAuthorizer*:	sjnX
recordMaintainer*:	nnsX
recordOriginator*:	PXPX
Type:	Concept X
Coordinate terms:	Gas Chromatography-Mass Spectrometry \| Spectrometry, Mass, Electrospray Ionization \| Spectrometry, Mass, Fast Atom Bombardment \| Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization \| Tandem Mass Spectrometry X
URI:	X
Labels and equivalent concepts:	Sekundaarinen ionimassaspektrometria (fi) Sekundaarinen ionimassaspektrografia (fi, replaced) SIMS Microscopy (en, replaced) Spectroscopy, Mass, Secondary Ion (en, replaced) Secondary Ion Mass Spectroscopy Microscopy (en, replaced) Secondary Ion Mass Spectroscopy (en, replaced) Mass Spectroscopy, Secondary Ion (en, replaced) Secondary Ion Mass Spectrometry (en, replaced) Secondary Ion Mass Spectrometry Microscopy (en, replaced) Mass Spectrometry, Secondary Ion (en, replaced) X
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