ONKI3 | Medical Subject Headings

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The way property values are displayed: value/row values side by side

The way concept relations are shown: separately in hierarchy

Microscopy, Atomic Force

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Hierarchy:	Medical Subject Headings (MeSH) ∟ Diagnosis ∟ Diagnostic Techniques and Procedures ∟ Diagnostic Imaging ∟ Microscopy ∟ Microscopy, Scanning Probe ∟ Microscopy, Atomic Force 1 coordinate concept ∟ Microscopy, Scanning Tunneling Medical Subject Headings (MeSH) ∟ Investigative Techniques ∟ Microscopy ∟ Microscopy, Scanning Probe ∟ Microscopy, Atomic Force 1 coordinate concept ∟ Microscopy, Scanning Tunneling Medical Subject Headings (MeSH) ∟ Natural Sciences ∟ Physics ∟ Optics ∟ Microscopy ∟ Microscopy, Scanning Probe ∟ Microscopy, Atomic Force 1 coordinate concept ∟ Microscopy, Scanning Tunneling X
Broader terms:	Medical Subject Headings (MeSH) ∟ Diagnosis ∟ Diagnostic Techniques and Procedures ∟ Diagnostic Imaging ∟ Microscopy ∟ Microscopy, Scanning Probe ∟ Microscopy, Atomic Force Medical Subject Headings (MeSH) ∟ Investigative Techniques ∟ Microscopy ∟ Microscopy, Scanning Probe ∟ Microscopy, Atomic Force Medical Subject Headings (MeSH) ∟ Natural Sciences ∟ Physics ∟ Optics ∟ Microscopy ∟ Microscopy, Scanning Probe ∟ Microscopy, Atomic Force Microscopy, Scanning Probe > Microscopy > Diagnostic Imaging > Diagnostic Techniques and Procedures > Diagnosis > Medical Subject Headings (MeSH) Microscopy, Scanning Probe > Microscopy > Investigative Techniques > Medical Subject Headings (MeSH) Microscopy, Scanning Probe > Microscopy > Optics > Physics > Natural Sciences > Medical Subject Headings (MeSH) X
History note:	Microscopy (1988-1994) \| Microscopy, Scanning Tunneling (1988-1994)X
historyNote*:	95 X
publicMeSHNote*:	95 X
Scope note:	A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. X
activeMeSHYear*:	2005 \| 2006 \| 2007X
dateCreated*:	1994-04-16X
dateEstablished*:	1995-01-01X
dateRevised*:	2004-07-07X
recordAuthorizer*:	sjnX
recordMaintainer*:	nnsX
recordOriginator*:	PXPX
Related term:	Microscopy, Scanning Tunneling X
Type:	Concept X
Coordinate terms:	Microscopy, Scanning Tunneling X
URI:	X
Labels and equivalent concepts:	Atomivoimamikroskopia (fi) Atomkraftmikroskopi (sv) Mikroskopi, atomkraft (sv, replaced) Scanning Force Microscopy (en, replaced) Force Microscopy (en, replaced) Atomic Force Microscopy (en, replaced) X
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