ONKI3 | Medical Subject Headings

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The way property values are displayed: value/row values side by side

The way concept relations are shown: separately in hierarchy

Microscopy, Electron, Scanning

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Hierarchy:	Medical Subject Headings (MeSH) ∟ Diagnosis ∟ Diagnostic Techniques and Procedures ∟ Diagnostic Imaging ∟ Microscopy ∟ Microscopy, Electron ∟ Microscopy, Electron, Scanning 4 coordinate concepts ∟ Cryoelectron Microscopy \| ∟ Electron Probe Microanalysis \| ∟ Microscopy, Electron, Transmission \| ∟ Microscopy, Immunoelectron Medical Subject Headings (MeSH) ∟ Investigative Techniques ∟ Microscopy ∟ Microscopy, Electron ∟ Microscopy, Electron, Scanning 4 coordinate concepts ∟ Cryoelectron Microscopy \| ∟ Electron Probe Microanalysis \| ∟ Microscopy, Electron, Transmission \| ∟ Microscopy, Immunoelectron Medical Subject Headings (MeSH) ∟ Natural Sciences ∟ Physics ∟ Optics ∟ Microscopy ∟ Microscopy, Electron ∟ Microscopy, Electron, Scanning 4 coordinate concepts ∟ Cryoelectron Microscopy \| ∟ Electron Probe Microanalysis \| ∟ Microscopy, Electron, Transmission \| ∟ Microscopy, Immunoelectron X
Broader terms:	Medical Subject Headings (MeSH) ∟ Diagnosis ∟ Diagnostic Techniques and Procedures ∟ Diagnostic Imaging ∟ Microscopy ∟ Microscopy, Electron ∟ Microscopy, Electron, Scanning Medical Subject Headings (MeSH) ∟ Investigative Techniques ∟ Microscopy ∟ Microscopy, Electron ∟ Microscopy, Electron, Scanning Medical Subject Headings (MeSH) ∟ Natural Sciences ∟ Physics ∟ Optics ∟ Microscopy ∟ Microscopy, Electron ∟ Microscopy, Electron, Scanning Microscopy, Electron > Microscopy > Diagnostic Imaging > Diagnostic Techniques and Procedures > Diagnosis > Medical Subject Headings (MeSH) Microscopy, Electron > Microscopy > Investigative Techniques > Medical Subject Headings (MeSH) Microscopy, Electron > Microscopy > Optics > Physics > Natural Sciences > Medical Subject Headings (MeSH) X
Annotation:	NIM; do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM; if in doubt, follow words of author; MICROSCOPY, SCANNING TUNNELING is also available X
History note:	Microscopy, Electron (1966-1968)X
historyNote*:	72(69) X
publicMeSHNote*:	72 X
Scope note:	Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. X
activeMeSHYear*:	2005 \| 2006 \| 2007X
dateCreated*:	1999-01-01X
dateEstablished*:	1972-01-01X
dateRevised*:	2004-07-07X
recordAuthorizer*:	sjnX
recordMaintainer*:	nnsX
recordOriginator*:	NLMX
Related term:	Corrosion Casting X
Type:	Concept X
Coordinate terms:	Cryoelectron Microscopy \| Electron Probe Microanalysis \| Microscopy, Electron, Transmission \| Microscopy, Immunoelectron X
URI:	X
Labels and equivalent concepts:	Pyyhkäisyelektronimikroskopia (fi) Svepelektronmikroskopi (sv) Mikroskopi, svepelektron (sv, replaced) Scanning Electron Microscopy (en, replaced) Electron Scanning Microscopy (en, replaced) X
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