The way property values are displayed:
The way concept relations are shown:
The way concept relations are shown:
Microscopy, Electron
Hierarchy: | ∟ ∟ ∟ ∟ ∟ Microscopy, Electron 10 coordinate concepts5 subordinate concepts∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Microscopy, Electron 10 coordinate concepts5 subordinate concepts∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ Microscopy, Electron 10 coordinate concepts5 subordinate concepts∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ ∟ |
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Annotation: | GEN: prefer specifics; relation to /ultrastruct: Manual 26.12.1
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Scope note: | Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
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activeMeSHYear*: | |
dateCreated*: | 1999-01-01X |
dateRevised*: | 2004-07-28X |
recordAuthorizer*: | jlsX |
recordMaintainer*: | jlsX |
recordOriginator*: | NLMX |
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Labels and equivalent concepts: | Elektronimikroskopia (fi) XEM (fi, replaced) Elektronmikroskopi (sv) Mikroskopi, elektron (sv, replaced) Electron Microscopy (en, replaced) Electronmicroscopia (la-FI, replaced) |
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